Handbook of Instrumentation and Techniques for Semiconductor Nanostructure Characterization

Atom Probe Tomography Plasmon Dynamics of Nanostructured Surfaces Scanning Tunneling Microscopy of Self Assembled III-V Nanostructures Nanomembranes Aberration Corrected Scanning Transmission Microscopy and Electron Energy Loss Rayleigh Scattering from Carbon Nanotubes Low Energy Electron Microscopy Studies of Nanostructured Semiconductor Surfaces Scanning Probe Microscopy of GaN Based Structures Time Domain Thermoreflectance for Thermal Characterization of Nanostructures X-Ray Studies of Nanostructures Single Nanowire Photoelectron Spectroscopy Ultra-High Vacuum Transmission Electron Microscopy Synthesis and Studies of Low-Dimensional Structures Raman Spectroscopy of Carbon Nanotubes Scanning Electron Microscopy for Characterization of Semiconducting Nanowires X-Ray Diffraction for Stress Determination in Nanostructures.