RF performance vulnerability to hot carrier stress and consequent breakdown in low power 90 nm RFCMOS
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L. Pantisano | R. Degraeve | B. Kaczer | D. Schreurs | G. Groeseneken | W. Jeamsaksiri | R. Degraeve | B. Kaczer | D. Schreurs | G. Groeseneken | K. Cheung | L. Pantisano | R. Venegas | R. Venegas | W. Jeamsaksiri | K.P. Cheung
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