Time resolved imaging using synchronous picosecond Photoelectric Laser Stimulation

Abstract This paper presents an improvement of the time resolution of the Photoelectric Laser Stimulation technique using the phase of a mode-locked laser as a reference to generate an electrical stimulus for the device under test. This synchronization system was applied to observe signal propagation in an 860 MHz ring oscillator.

[1]  G. Woods,et al.  Optical probing of flip-chip-packaged microprocessors , 2000, 2000 IEEE International Solid-State Circuits Conference. Digest of Technical Papers (Cat. No.00CH37056).

[2]  Jeremy A. Rowlette,et al.  Critical timing analysis in microprocessors using near-ir laser assisted device alteration (lada) , 2003, International Test Conference, 2003. Proceedings. ITC 2003..

[3]  J. Kash,et al.  Picosecond hot electron light emission from submicron complementary metal–oxide–semiconductor circuits , 1997 .

[4]  Dean Lewis,et al.  Time-resolved scanning of integrated circuits with a pulsed laser: application to transient fault injection in an ADC , 2004, IEEE Transactions on Instrumentation and Measurement.

[5]  Philippe Perdu,et al.  Electrical modeling for laser testing with different pulse durations , 2005, 11th IEEE International On-Line Testing Symposium.