论文信息 - Field emission observation of carbon nanosheet thin film by photoelectron emission microscopy (PEEM)

Field emission observation of carbon nanosheet thin film by photoelectron emission microscopy (PEEM)

In this study, the field emission characterization of carbon nanosheet thin film was conducted using a diode configuration with an anode-cathode distance of 254 mum. Photoelectron emission microscopy (PEEM) was used to investigate the field emission uniformity over the surfaces of carbon nanosheet thin films.

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