Probe tip invasiveness at indirect electro-optic sampling of MMIC

Electric field disturbances induced by an electrooptic (EO) probe tip have been experimentally investigated up to 40 GHz by means of direct EO sampling. The results are compared with conventional network analyzer measurements. A field distortion depending on the working distance between the EO probe tip and the tested circuit, which has to be taken into account when using this technique for MMIC (monolithic microwave integrated circuit) characterization above 30 GHz, is shown.<<ETX>>

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