Characterization of ultrathin SOI film and application to short channel MOSFETs
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D. Flandre | J. Raskin | E. Dubois | Xiaohui Tang | B. Nysten | A. Jonas | N. Reckinger | G. Larrieu | V. Bayot
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D. Flandre | J. Raskin | E. Dubois | Xiaohui Tang | B. Nysten | A. Jonas | N. Reckinger | G. Larrieu | V. Bayot