Extraction of channel mobility in nanowire MOSFETs using Id(Vg) characteristics and random telegraph noise amplitude
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A. Kranti | R. Yan | N. Akhavan | J. Colinge | I. Ferain | R. Yu | C. Lee | P. Razavi | A. Nazarov
暂无分享,去创建一个
A. Kranti | R. Yan | N. Akhavan | J. Colinge | I. Ferain | R. Yu | C. Lee | P. Razavi | A. Nazarov