Distortion and overlay performance of UV step and repeat imprint lithography
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S. V. Sreenivasan | William J. Dauksher | Kevin J. Nordquist | K. Gehoski | Douglas J. Resnick | Jin Choi | S. Sreenivasan | D. Resnick | K. Gehoski | K. Nordquist | W. Dauksher | Ashuman Cherala | Lester Casoose | Jin Choi | Ashuman Cherala | L. Casoose
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