Flaw-Containing Alumina Hollow Nanostructures Have Ultrahigh Fracture Strength To Be Incorporated into High-Efficiency GaN Light-Emitting Diodes.
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Juyoung Kim | E. Yoon | I. Choi | D. Moon | Jeonghwan Jang | H. Han | Sung-gyu Kang | Jin-Yoo Suh