Recent Results for Commercial Microprocessor Testing

Commercial microprocessors could be useful for space missions that do not require radiation-hardened microprocessors. For these missions, commercial microprocessors provide a lower power and less costly solution for data processing than a radiation-hardened microprocessor. Commercial microprocessors are more likely to have issues with single-event effects (SEEs) that could make it difficult to compute without faults. It is possible through part selection and radiation testing to eliminate commercial microprocessors with the most destructive radiation effects. This paper presents data on recent testing of several commercial microprocessors.

[1]  Jean-Luc Gaudiot,et al.  Tolerating Radiation-Induced Transient Faults in Modern Processors , 2010, International Journal of Parallel Programming.

[2]  Steven M. Guertin,et al.  Using Benchmarks for Radiation Testing of Microprocessors and FPGAs , 2015, IEEE Transactions on Nuclear Science.

[3]  Joseph R Marshall SpaceWire Satellite Usage , 2013 .

[4]  A. KleinOsowski,et al.  Clock and Reset Transients in a 90 nm RHBD Single-Core Tilera Processor , 2009, IEEE Transactions on Nuclear Science.

[5]  D. M. Hiemstra,et al.  Single event upset characterization of the Pentium(R) MMX and Celeron(R) microprocessors using proton irradiation , 2000, 2000 IEEE Radiation Effects Data Workshop. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.00TH8527).

[6]  D. M. Hiemstra,et al.  Single event upset characterization of the Pentium(R) MMX and Pentium(R) II microprocessors using proton irradiation , 1999 .

[7]  Jiri Gaisler A portable and fault-tolerant microprocessor based on the SPARC v8 architecture , 2002, Proceedings International Conference on Dependable Systems and Networks.

[8]  D.M. Hienistra,et al.  Single event upset characterization of the Pentium(R) MMX and low power Pentium(R) MMX microprocessors using proton irradiation , 2001, 2001 IEEE Radiation Effects Data Workshop. NSREC 2001. Workshop Record. Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference (Cat. No.01TH8588).

[9]  Bharat L. Bhuva,et al.  Analysis of Bulk FinFET Structural Effects on Single-Event Cross Sections , 2017, IEEE Transactions on Nuclear Science.

[10]  Heather Quinn,et al.  Compendium of TID, Neutron, Proton and Heavy Ion Testing of Satellite Electronics for Los Alamos National Laboratory , 2013, 2013 IEEE Radiation Effects Data Workshop (REDW).

[11]  Heather Quinn,et al.  Robust Duplication With Comparison Methods in Microcontrollers , 2017, IEEE Transactions on Nuclear Science.

[12]  Heather Quinn,et al.  Single-Event Effects in Low-Cost, Low-Power Microprocessors , 2014, 2014 IEEE Radiation Effects Data Workshop (REDW).

[13]  Farokh Irom,et al.  Single-event upset in the PowerPC750 microprocessor , 2001 .

[14]  Heather Quinn,et al.  Software Resilience and the Effectiveness of Software Mitigation in Microcontrollers , 2015, IEEE Transactions on Nuclear Science.