The Fault Detection by the Dynamic Pattern Test through ASIC Data Extraction and Analysis
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If there don’t have the Test Requirement Document (TRD), it is impossible to analyze the operation of circuit and detect the fault in ASIC. Therefore, we created the TRD based on analyzed logic data extracted from ASIC, and diagnosis on the ASIC circuits at the point of level of gate. Also test board is controlled by signal of I/O pins utilizing Dynamic Pattern Test. We could identify the 17 pattern from tests, and figure out faults in 16 addresses. According to the experiment for target board applied with proposed methods, it is possible to diagnose fault for abnormal computerized chip, ASIC, by utilizing test unit board. We’ve also obtained the excellent performance for fault detection.