Multiwavelength laser scattering tomography

The phenomenon of laser light scattering provides the technology for visualization and testing the inner structure and homogeneity of materials. Some of them excited by the laser light in the tomographic process can emit light the wavelength of which is different than that of excitation laser. Such photoluminescence can be a source of additional information of the material’s structure. Combining the Laser Scattering Tomography (LST) and Spectrometry techniques has enabled us to develop a new type of an LST technique. The system is useful for investigations of various materials like semiconductors (Si, GaAs) ceramics, crystals for passive absorbers for high power pulse lasers, and laser crystals.

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