Comparison of charge yield in MOS devices for different radiation sources
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Marty R. Shaneyfelt | J. R. Schwank | P. Paillet | V. Ferlet-Cavrois | Ewart William Blackmore | J. Schwank | M. Shaneyfelt | E. Blackmore | P. Paillet | V. Ferlet-Cavrois | R. L. Jones | R. L. Jones | O. Flarrient | O. Flarrient
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