Reaching Coverage Closure in Post-silicon Validation

Obtaining coverage information in post-silicon validation is a difficult task. Adding coverage monitors to the silicon is costly in terms of timing, power, and area, and thus even if feasible, is limited to a small number of coverage monitors. We propose a new method for reaching coverage closure in post-silicon validation. The method is based on executing the post-silicon exercisers on a pre-silicon acceleration platform, collecting coverage information from these runs, and harvesting important test templates based on their coverage. This method was used in the verification of IBM's POWER7 processor. It contributed to the overall high-quality verification of the processor, and specifically to the post-silicon validation and bring-up.

[1]  Shmuel Ur,et al.  Compacting regression-suites on-the-fly , 1997, Proceedings of Joint 4th International Computer Science Conference and 4th Asia Pacific Software Engineering Conference.

[2]  Alan J. Hu,et al.  BackSpace: Formal Analysis for Post-Silicon Debug , 2008, 2008 Formal Methods in Computer-Aided Design.

[3]  Andrew Piziali,et al.  Functional verification coverage measurement and analysis , 2004 .

[4]  Avi Ziv,et al.  A probabilistic alternative to regression suites , 2004, Theor. Comput. Sci..

[5]  Wolfgang Roesner,et al.  Comprehensive Functional Verification: The Complete Industry Cycle (Systems on Silicon) , 2005 .

[6]  Todd M. Austin,et al.  Shielding against design flaws with field repairable control logic , 2006, 2006 43rd ACM/IEEE Design Automation Conference.

[7]  Avi Ziv,et al.  Using a constraint satisfaction formulation and solution techniques for random test program generation , 2002, IBM Syst. J..

[8]  Louise Trevillyan,et al.  EDA in IBM: past, present, and future , 2000, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[9]  Allon Adir,et al.  Genesys-Pro: innovations in test program generation for functional processor verification , 2004, IEEE Design & Test of Computers.

[10]  Gérard Memmi,et al.  A reconfigurable design-for-debug infrastructure for SoCs , 2006, 2006 43rd ACM/IEEE Design Automation Conference.

[11]  David S. Johnson,et al.  Computers and Intractability: A Guide to the Theory of NP-Completeness , 1978 .

[12]  Sharad Malik,et al.  Runtime validation of memory ordering using constraint graph checking , 2008, 2008 IEEE 14th International Symposium on High Performance Computer Architecture.

[13]  Vasek Chvátal,et al.  A Greedy Heuristic for the Set-Covering Problem , 1979, Math. Oper. Res..

[14]  Wolfgang Roesner,et al.  Comprehensive Functional Verification: The Complete Industry Cycle , 2005 .

[15]  H. G. Rotithor,et al.  Postsilicon Validation Methodology for Microprocessors , 2000, IEEE Des. Test Comput..

[16]  Avi Ziv,et al.  Probabilistic regression suites for functional verification , 2004, Proceedings. 41st Design Automation Conference, 2004..

[17]  Igor L. Markov,et al.  Automating post-silicon debugging and repair , 2007, ICCAD 2007.