论文信息 - High-resolution study of x-ray resonant Raman scattering at the K edge of silicon. - 字舞流文

High-resolution study of x-ray resonant Raman scattering at the K edge of silicon.

R. Barrett | J. Szlachetko | A. Kubala-Kukuś | J. Hoszowska | J. Dousse | M. Pajek | M. Berset | M. Szlachetko | K. Fennane