A simple physical theory is developed which permits a calculation of the significant points of avalanche transistor transient behavior. A model for the transistor is defined in terms of charge variables and the physical parameters of the device. The transient performance of the model is calculated by focusing attention on the minority carrier charge stored in the base region and the influence of basewidth modulation upon this stored charge. In the charge formulation of the problem, the physical details of the avalanche multiplication process need not be considered; multiplication is accounted for by the boundary conditions which it imposes upon the stored charge. Good agreement has been obtained between calculated and experimentally observed data for a simple avalanche transistor relaxation oscillator.
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