Mixed flowing gas studies of creep corrosion on plastic encapsulated microcircuit packages with noble metal pre-plated leadframes

This paper describes tests and analysis of creep corrosion on plastic encapsulated electronic components with Ni/Pd or Ni/Pd/Au plated copper leadframes. Samples were subjected to three standard mixed flowing gas (MFG) tests to simulate corrosion effects in an accelerated manner, which included Telcordia Outdoor, and Battelle Class III Telcordia Indoor MFG environments. With an MFG exposure of 10 days, creep corrosion was observed over the plastic molding compound surface in the first two of the test environments. The formation and thickness of creep corrosion products on molding compound surface were characterized by microscopic observation. A four-decade drop in insulation resistance was measured between adjacent leads with visible bridging of corrosion products. Energy dispersive spectroscopy (EDS) was used to assess the elemental composition of corrosion products on both the component leads and the molding compound surfaces, and corrosion products were found to be copper salts. Sample pre-conditions, including surface cleaning, mold compound surface roughness, additional lead scratches, and applied voltage biases, were evaluated, and found to have no significant effects on the creep corrosion process. Conformal coating of the components was found to be an effective mitigation strategy to eliminate creep corrosion on packages with noble metal pre-plated leadframes.

[1]  Christofer Leygraf Atmospheric corrosion , 2000 .

[2]  Michael Pecht,et al.  An investigation of the electrical contact resistance of corroded pore sites on gold plated surfaces , 2000 .

[3]  M. Osterman,et al.  Tin whiskering risk factors , 2004, IEEE Transactions on Components and Packaging Technologies.

[4]  D. C. Abbott Nickel/palladium finish for leadframes , 1999 .

[5]  Anthony J. Rafanelli,et al.  Plastic Encapsulated Microelectronics; Materials, Processes, Quality, Reliability, and Application , 1997 .

[6]  J. S. Wiley,et al.  Palladium as a lead finish for surface mount integrated circuit packages , 1991 .

[7]  Michael G. Pecht,et al.  Field failure due to creep corrosion on components with palladium pre-plated leadframes , 2003, Microelectron. Reliab..

[8]  J. R. Kirby,et al.  Corrosive gas environmental testing for electrical contacts , 1989, Proceedings of the Thirty Fifth Meeting of the IEEE Holm Conference on Electrical Contacts.

[9]  Qualification testing of automotive terminals for high reliability applications , 1993, Proceedings of IEEE 43rd Electronic Components and Technology Conference (ECTC '93).

[10]  M. Antler,et al.  Gold Connector Contacts: Developments in the Search for Alternate Materials , 1975 .

[11]  Paul G. Slade,et al.  Electrical contacts : principles and applications , 1999 .

[12]  W. Abbott The development and performance characteristics of mixed flowing gas test environment , 1988 .

[13]  D.W.M. Williams The effect of test environment on the creep of base metal surface films over precious metal inlays , 1988 .

[14]  S. Rajagopal,et al.  The impact of lead-free legislation exemptions on the electronics industry , 2004, IEEE Transactions on Electronics Packaging Manufacturing.

[15]  V. Tierney,et al.  The Nature and Rate of Creepage of Copper Sulfide Tarnish Films over Gold , 1981 .

[16]  J.L. Chao,et al.  Evaluation of a mixed flowing gas test , 1991, Electrical Contacts - 1991 Proceedings of the Thirty-Seventh IEEE HOLM Conference on Electrical Contacts.

[17]  T. F. Egan,et al.  Creeping Silver Sulfide , 1960 .

[18]  R. Geckle,et al.  Corrosion of precious metal plated copper alloys due to mixed flowing gas exposure , 1990, Thirty-Sixth IEEE Conference on Electrical Contacts, and the Fifteenth International Conference on Electrical Contacts.