A Novel BJT Structure Implemented Using CMOS Processes for High-Performance Analog Circuit Applications
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Sung-Kyu Kwon | Jae-Hyung Jang | Hyuk-Min Kwon | Yi-Jung Jung | Yi-Sun Chung | Hi-Deok Lee | Jung-Hwan Lee | Ho-Young Kwak | Byoung-Seok Park
[1] Benno Krabbenborg,et al. Advanced BCD technology for automotive, audio and power applications , 2007 .
[2] A. Abidi,et al. A 50 dB variable gain amplifier using parasitic bipolar transistors in CMOS , 1988, Symposium 1988 on VLSI Circuits.
[3] A.H. Montree,et al. Effects of gate depletion and boron penetration on matching of deep submicron CMOS transistors , 1997, International Electron Devices Meeting. IEDM Technical Digest.
[4] M.J.M. Pelgrom,et al. Matching properties of MOS transistors , 1989 .
[5] Eric A. Vittoz,et al. CMOS voltage references using lateral bipolar transistors , 1985 .
[6] R. J. Widlar,et al. New developments in IC voltage regulators , 1970 .
[7] G. Ghibaudo,et al. A New Model for Threshold Voltage Mismatch Based on the Random Fluctuations of Dopant Number in the MOS Transistor Gate , 2001, 31st European Solid-State Device Research Conference.
[8] H. P. Tuinhout. Electrical characterisation of matched pairs for evaluation of integrated circuit technologies , 2005 .
[9] N. Wils,et al. Identification and analysis of a new BJT parametric mismatch phenomenon , 2005, Proceedings of the Bipolar/BiCMOS Circuits and Technology Meeting, 2005..
[10] W. T. Holman,et al. A compact low noise operational amplifier for a 1.2 /spl mu/m digital CMOS technology , 1995 .
[11] Willy Sansen,et al. Matching Properties of Deep Sub-Micron MOS Transistors , 2005 .
[12] H. P. Tuinhout. Improving BiCMOS technologies using BJT parametric mismatch characterisation , 2003, 2003 Proceedings of the Bipolar/BiCMOS Circuits and Technology Meeting (IEEE Cat. No.03CH37440).
[13] H. Tuinhout,et al. Measurement of lithographical proximity effects on matching of bipolar transistors , 1998, ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157).
[14] O. Schade. BiMOS micropower ICs , 1978, 1978 IEEE International Solid-State Circuits Conference. Digest of Technical Papers.
[15] Marcel J. M. Pelgrom,et al. Matching properties of MOS transistors , 1989 .
[16] Hi-Deok Lee,et al. Novel BJT test structure for high-performance matching characteristics in CMOS-based analog applications , 2011, 2011 IEEE ICMTS International Conference on Microelectronic Test Structures.
[17] E. Vittoz. MOS transistors operated in the lateral bipolar mode and their application in CMOS technology , 1983, IEEE Journal of Solid-State Circuits.
[18] Mougahed Darwish,et al. C‐MOS and Complementary Isolated Bipolar Transistor Monolithic Integration Process , 1974 .
[19] H. Tuinhout. Impact of Parametric Fluctuations on Performance and Yield of Deep-Submicron Technologies , 2002, 32nd European Solid-State Device Research Conference.