Test Pattern Generation for ID~Q: Increasing Test Quality*

out any regard to the actual value of IDDQ provoked 5’0 far, the test pattern generation for ID,, testing has been performed without considerin.g the value of the faulty current in comparison with the minimum current that is detectable as a fault: this approach will be shown to be misleading, since it actually gives optimistic coverage evaluation. Then, this work presents an ATPG strategy that targets the highest values of current during the fault activation, in such a way that either a higher fault coverage can be obtaaned or a less accurate sensor can be used.

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