Modeling the faulty behaviour of digital designs using a feed forward neural network approach
暂无分享,去创建一个
[1] Raoul Velazco,et al. A Survey on Fault Injection Techniques , 2004, Int. Arab J. Inf. Technol..
[2] Stephen R. Marsland,et al. Machine Learning - An Algorithmic Perspective , 2009, Chapman and Hall / CRC machine learning and pattern recognition series.
[3] Whei-Min Lin,et al. A Fault Classification Method by RBF Neural Network with OLS Learning Procedure , 2001 .
[4] Yichuang Sun,et al. A New Neural-Network-Based Fault Diagnosis Approach for Analog Circuits by Using Kurtosis and Entropy as a Preprocessor , 2010, IEEE Transactions on Instrumentation and Measurement.
[5] Michelangelo Grosso,et al. Exploiting Fault Model Correlations to Accelerate SEU Sensitivity Assessment , 2013, IEEE Transactions on Industrial Informatics.
[6] L. Dominik,et al. System mitigation techniques for single event effects , 2008, 2008 IEEE/AIAA 27th Digital Avionics Systems Conference.
[7] Yvon Savaria,et al. A methodology for system-level fault injection based on gate-level faulty behavior , 2013, 2013 IEEE 11th International New Circuits and Systems Conference (NEWCAS).
[8] A. Taber,et al. Single event upset in avionics , 1993 .
[9] Luigi Carro,et al. On the use of VHDL simulation and emulation to derive error rates , 2001, RADECS 2001. 2001 6th European Conference on Radiation and Its Effects on Components and Systems (Cat. No.01TH8605).
[10] L. Entrena,et al. Advanced Simulation and Emulation Techniques for Fault Injection , 2007, 2007 IEEE International Symposium on Industrial Electronics.
[11] Anil K. Jain,et al. Artificial Neural Networks: A Tutorial , 1996, Computer.
[12] Hana Kubatova,et al. Fault Models Usability Study for On-line Tested FPGA , 2011, 2011 14th Euromicro Conference on Digital System Design.
[13] W. H. Robinson,et al. Fault Simulation and Emulation Tools to Augment Radiation-Hardness Assurance Testing , 2013, IEEE Transactions on Nuclear Science.
[14] Yvon Savaria,et al. Early Analysis of Soft Error Effects for Aerospace Applications Using Probabilistic Model Checking , 2013, FTSCS.
[15] Chiara Sandionigi,et al. Fault Classification for SRAM-Based FPGAs in the Space Environment for Fault Mitigation , 2010, IEEE Embedded Systems Letters.
[16] Vishwani D. Agrawal,et al. Essentials of electronic testing for digital, memory, and mixed-signal VLSI circuits [Book Review] , 2000, IEEE Circuits and Devices Magazine.
[17] Heaton T. Jeff,et al. Introduction to Neural Networks with Java , 2005 .
[18] Ricardo Reis,et al. Soft error rate in SRAM-based FPGAs under neutron-induced and TID effects , 2014, 2014 15th Latin American Test Workshop - LATW.
[19] Shubu Mukherjee,et al. Architecture Design for Soft Errors , 2008 .
[20] Qi-Jun Zhang,et al. Artificial neural networks for RF and microwave design - from theory to practice , 2003 .
[21] Hossein Rabbani,et al. A fast method for video deblurring based on a combination of gradient methods and denoising algorithms in Matlab and C environments , 2010, Electronic Imaging.
[22] T. Arslan,et al. Artificial neural network based multiple fault diagnosis in digital circuits , 1998, ISCAS '98. Proceedings of the 1998 IEEE International Symposium on Circuits and Systems (Cat. No.98CH36187).
[23] Parag K. Lala,et al. Fault injection for verifying testability at the VHDL level , 2003, International Test Conference, 2003. Proceedings. ITC 2003..
[24] Sara Blanc,et al. Enhancement of Fault Injection Techniques Based on the Modification of VHDL Code , 2008, IEEE Transactions on Very Large Scale Integration (VLSI) Systems.
[25] Ibrahim Farhat. Fault detection, classification and location in transmission line systems using neural networks , 2003 .
[26] Régis Leveugle,et al. Using run-time reconfiguration for fault injection in hardware prototypes , 2000, 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2002. DFT 2002. Proceedings..
[27] Janak H. Patel,et al. Stuck-at fault: a fault model for the next millennium , 1998, Proceedings International Test Conference 1998 (IEEE Cat. No.98CH36270).
[28] Ricardo Reis,et al. Radiation Effects on Embedded Systems , 2010 .
[29] Simon Haykin,et al. Neural Networks: A Comprehensive Foundation , 1998 .
[30] Giorgio Di Natale,et al. LIFTING: A Flexible Open-Source Fault Simulator , 2008, 2008 17th Asian Test Symposium.
[31] A. Lesea,et al. The rosetta experiment: atmospheric soft error rate testing in differing technology FPGAs , 2005, IEEE Transactions on Device and Materials Reliability.
[32] Laurene V. Fausett,et al. Fundamentals Of Neural Networks , 1993 .
[33] E. Normand. Single-event effects in avionics , 1996 .
[34] K. S. Beenamole,et al. Understanding single-Event effects in FPGA for Avionic system design , 2013 .
[35] K.S. Morgan,et al. SRAM FPGA Reliability Analysis for Harsh Radiation Environments , 2009, IEEE Transactions on Nuclear Science.
[36] M. E. Nelson,et al. Terrestrial thermal neutrons , 2003 .
[37] Alfredo Benso,et al. Fault Injection Techniques and Tools for Embedded Systems , 2003 .