Influence of reflow and thermal aging on the shear strength and fracture behavior of Sn-3.5Ag solder/Cu joints

The mechanical behavior of Sn-rich solder/Cu joints is highly sensitive to processing variables such as solder reflow time, cooling rate, and subsequent thermal aging. In this article, we focus on the lap shear behavior of Sn-3.5Ag/Cu joints as a function of solder yield strength and intermetallic thickness. Experimental results showed that the shear strength of the solder joints is primarily controlled by the mechanical properties of the solder, and not the intermetallic thickness. The thickness of intermetallic, however, controlled the fracture mode of the solder joints. At intermetallic thicknesses greater than 20 µm, brittle fracture between Cu6Sn5 and Cu3Sn was the most common failure mechanism. Finite-element simulations were carried out to evaluate the effect of solder properties and of intermetallic thickness and morphology on lap shear behavior. The finite-element simulations corroborated the experimental findings, i.e., that increased solder strength results in increased joint strength. The simulations also showed that thicker intermetallics, especially of nodular morphology, yielded higher local plastic shear strain and work hardening rate.

[1]  R. A. Fournelle,et al.  Copper substrate dissolution in eutectic Sn-Ag solder and its effect on microstructure , 2000 .

[2]  Nikhilesh Chawla,et al.  Effects of cooling rate on the microstructure and tensile behavior of a Sn-3.5wt.%Ag solder , 2003 .

[3]  J. Glazer Microstructure and mechanical properties of Pb-free solder alloys for low-cost electronic assembly: A review , 1994 .

[4]  M. Abtew,et al.  Lead-free Solders in Microelectronics , 2000 .

[5]  Y. C. Chan,et al.  Growth kinetic studies of Cu–Sn intermetallic compound and its effect on shear strength of LCCC SMT solder joints , 1998 .

[6]  Nikhilesh Chawla,et al.  The effects of cooling rate on microstructure and mechanical behavior of Sn-3.5Ag solder , 2003 .

[7]  Dong Ma,et al.  Scallop formation and dissolution of Cu–Sn intermetallic compound during solder reflow , 2002 .

[8]  E. P. Wood,et al.  In search of new lead-free electronic solders , 1994 .

[9]  Hwa-Teng Lee,et al.  Influence of interfacial intermetallic compound on fracture behavior of solder joints , 2003 .

[10]  D. J. Xie,et al.  Experimental studies of pore formation in surface mount solder joints , 1996 .

[11]  K. Suganuma,et al.  Joint reliability and high temperature stability of Sn–Ag–Bi lead-free solder with Cu and Sn–Pb/Ni/Cu substrates , 2004 .

[12]  Y. Chang,et al.  Reactions of solid copper with pure liquid tin and liquid tin saturated with copper , 1997 .

[13]  Nikhilesh Chawla,et al.  Young's modulus of (Cu, Ag)-Sn intermetallics measured by nanoindentation , 2004 .

[14]  M. Hon,et al.  The adhesion strength of A lead-free solder hot-dipped on copper substrate , 2000 .

[15]  P. Protsenko,et al.  The role of intermetallics in wetting in metallic systems , 2001 .

[16]  C. Kao Microstructures developed in solid-liquid reactions: using Cu-Sn reaction, Ni-Bi reaction, and Cu-In reaction as examples , 1997 .

[17]  W. Mullins Theory of Thermal Grooving , 1957 .

[18]  D. R. Frear,et al.  The mechanical behavior of interconnect materials for electronic packaging , 1996 .

[19]  Kourosh Danai,et al.  Experimental Evaluation of a Structure-Based Connectionist Network for Fault Diagnosis of Helicopter Gearboxes , 1998 .

[20]  Wenge Yang,et al.  The effect of soldering process variables on the microstructure and mechanical properties of eutectic Sn-Ag/Cu solder joints , 1995 .

[21]  Hasan U. Akay,et al.  A Finite Element Study of Factors Affecting Fatigue Life of Solder Joints , 1994 .

[22]  Nikhilesh Chawla,et al.  Influence of initial morphology and thickness of Cu6Sn5 and Cu3Sn intermetallics on growth and evolution during thermal aging of Sn-Ag solder/Cu joints , 2003 .

[23]  Taekoo Lee,et al.  Finite element analysis for solder ball failures in chip scale package , 1998 .

[24]  Nikhilesh Chawla,et al.  Deformation behavior of (Cu, Ag)–Sn intermetallics by nanoindentation , 2004 .

[25]  Makoto Kitano,et al.  Modeling Complex Inelastic Deformation Processes in IC Packages’ Solder Joints , 1994 .

[26]  King-Ning Tu,et al.  Kinetics of interfacial reaction in bimetallic CuSn thin films , 1982 .

[27]  J. Duh,et al.  Microstructure evolution in Sn–Bi and Sn–Bi–Cu solder joints under thermal aging , 2001 .

[28]  Z. P. Wang,et al.  Microstructure and intermetallic growth effects on shear and fatigue strength of solder joints subjected to thermal cycling aging , 2001 .

[29]  David J. Quesnel,et al.  Mode I fracture toughness testing of eutectic Sn-Pb solder joints , 1994 .

[30]  Thirumany Sritharan,et al.  Interface reaction between copper and molten tin–lead solders , 2001 .

[31]  J. W. Morris,et al.  Analysis of low-temperature intermetallic growth in copper-tin diffusion couples , 1992 .

[32]  B. A. Cook,et al.  Shear deformation in Sn-3.5Ag and Sn-3.6Ag-1.0Cu solder joints subjected to asymmetric four-point bend tests , 2001 .

[33]  Fu Guo,et al.  Effects of reflow on wettability, microstructure and mechanical properties in lead-free solders , 2000 .

[34]  D. Frear,et al.  Intermetallic growth and mechanical behavior of low and high melting temperature solder alloys , 1994 .

[35]  Won Kyoung Choi,et al.  Effect of soldering and aging time on interfacial microstructure and growth of intermetallic compounds between Sn-3.5Ag solder alloy and Cu substrate , 2000 .