"AU: Timing Analysis Under Uncertainty

Due to excessive reduction in the gate length, dopant concentrationsand the oxide thickness, even the slightest of variations inthese quantities can result in significant variations in the performanceof a device. This has resulted in a need for efficient andaccurate techniques for performing Statistical Analysis of circuits.In this paper we propose a methodology based on Bayesian Networksfor computing the exact probability distribution of the delayof a circuit. In case of large circuits where it is not possible tocompute the exact distribution, we propose methods to reduce theproblem size and get a tight lower bound on the exact distribution.

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