Electroless nickel bumping of aluminum bondpads. II. Electroless nickel plating

Electroless nickel has been used for many decades to provide a hard, corrosion resistant surface finish to engineering components. In recent years, its application has been extended to the electronics industry for the production of solderable surfaces on printed circuit boards, which utilize a further thin gold coating to prevent oxidation of the nickel surface. The recent interest in the use of flip-chip technology in electronics manufacture has required the development of low cost methods for solder bumping of semiconductor wafers. The electroless nickel process has been considered as a suitable candidate for the deposition of a solderable under bump metallization (UBM) layer onto the Al bondpads. However, the extension of existing electroless nickel plating processes to this new application requires greater understanding of the technique. In particular, the coating of the small isolated bondpads on the wafer surface introduces difficulties that make the use of many commercially available solutions impossible. This paper reports the results of a number of experiments carried out to investigate the electroless nickel bumping of Al bondpads and highlights the issues that need to be considered when selecting materials and techniques.

[1]  R. Erich,et al.  Shear testing and failure mode analysis for evaluation of BGA ball attachment , 1999, Twenty Fourth IEEE/CPMT International Electronics Manufacturing Technology Symposium (Cat. No.99CH36330).

[2]  J.J. Lee,et al.  The effect of Au plating thickness of BGA substrates on ball shear strength under reliability tests , 1999, Twenty Fourth IEEE/CPMT International Electronics Manufacturing Technology Symposium (Cat. No.99CH36330).

[3]  Andre M. T. van der Putten,et al.  Anisotropic Deposition of Electroless Nickel Bevel Plating , 1993 .

[4]  Hideo Honma,et al.  Fabrication of Nickel Microbump on Aluminum using Electroless Nickel Plating , 1997 .

[5]  Wolfgang Riedel,et al.  Electroless Nickel Plating , 1991 .

[6]  X. Chen,et al.  Electroless nickel bath for wafer bumping: influence of additives , 2000, International Symposium on Electronic Materials and Packaging (EMAP2000) (Cat. No.00EX458).

[7]  M.T.W. de Langen Low Cost Flip Chip Technology , 1997 .

[8]  Herbert Reichl,et al.  A Low Cost Bumping Process For Flip Chip-technology Using Electroless Nickel Bumping And Solder Ball Placement , 1997, IEMT/IMC Symposium, 1st [Joint International Electronic Manufacturing Symposium and the International Microelectronics Conference].

[9]  C. Beddingfield,et al.  Reliability evaluation of probe-before-bump technology , 1999, Twenty Fourth IEEE/CPMT International Electronics Manufacturing Technology Symposium (Cat. No.99CH36330).

[10]  M. Kaufmann,et al.  Brittle interfacial fracture of PBGA packages soldered on electroless nickel/immersion gold , 1998, 1998 Proceedings. 48th Electronic Components and Technology Conference (Cat. No.98CH36206).

[11]  T. I. Ejim,et al.  The influence of nickel/gold surface finish on the assembly quality and long term reliability of thermally enhanced BGA packages , 1999, Twenty Fourth IEEE/CPMT International Electronics Manufacturing Technology Symposium (Cat. No.99CH36330).

[12]  Glenn A. Rinne Solder bumping methods for flip chip packaging , 1997, 1997 Proceedings 47th Electronic Components and Technology Conference.

[13]  Andre M. T. van der Putten,et al.  Geometrical Effects in the Electroless Metallization of Fine Metal Patterns , 1993 .

[14]  J. De Baets,et al.  Stabilizer Concentration and Local Environment: Their Effects on Electroless Nickel Plating of PCB Micropads , 1999 .

[15]  Andreas Ostmann,et al.  Fine pitch stencil printing of Sn/Pb and lead free solders for flip chip technology , 1997, 1997 Proceedings 47th Electronic Components and Technology Conference.

[16]  Paul Conway,et al.  Electroless nickel bumping of aluminum bondpads. I. Surface pretreatment and activation , 2002 .