Triple-wavelength, narrowband Mg/SiC multilayers with corrosion barriers and high peak reflectance in the 25-80 nm wavelength region.
暂无分享,去创建一个
Regina Soufli | Mónica Fernández-Perea | Luis Rodríguez-De Marcos | Juan I Larruquert | Eric M Gullikson | Jeff C Robinson | Jose A Méndez
[1] Piergiorgio Nicolosi,et al. Long-Term Stability of Mg/SiC Multilayers , 2012 .
[2] Mónica Fernández-Perea,et al. Narrowband multilayer coatings for the extreme ultraviolet range of 50-92 nm. , 2009, Optics express.
[3] Regina Soufli,et al. Sub-diffraction-limited multilayer coatings for the 0.3 numerical aperture micro-exposure tool for extreme ultraviolet lithography. , 2007, Applied optics.
[4] James Bremer,et al. Measurement of zone plate efficiencies in the extreme ultraviolet and applications to radiation monitors for absolute spectral emission , 2006, SPIE Optics + Photonics.
[5] Regina Soufli,et al. Spontaneously intermixed Al-Mg barriers enable corrosion-resistant Mg/SiC multilayer coatings , 2012 .
[6] Regina Soufli,et al. Development and testing of EUV multilayer coatings for the atmospheric imaging assembly instrument aboard the Solar Dynamics Observatory , 2005, SPIE Optics + Photonics.
[7] Regina Soufli,et al. Initial Calibration of the Atmospheric Imaging Assembly (AIA) on the Solar Dynamics Observatory (SDO) , 2012 .
[8] J. Rocca,et al. Extreme ultraviolet photoionization of aldoses and ketoses , 2011 .
[9] Farhad Salmassi,et al. Optical constants of magnetron-sputtered magnesium films in the 25–1300 eV energy range , 2010 .
[10] T. Ejima,et al. Two-Color Reflection Multilayers for He-I and He-II Resonance Lines for Microscopic Ultraviolet Photoelectron Spectroscopy Using Schwarzschild Objective. , 2001 .
[11] David L. Windt,et al. IMD—software for modeling the optical properties of multilayer films , 1998 .
[12] Yanwei Liu,et al. Tri-material multilayer coatings with high reflectivity and wide bandwidth for 25 to 50 nm extreme ultraviolet light. , 2009, Optics express.
[13] Libor Juha,et al. Subnanometer-scale measurements of the interaction of ultrafast soft x-ray free-electron-laser pulses with matter. , 2006, Physical review letters.
[14] B. Pontieu,et al. The Origins of Hot Plasma in the Solar Corona , 2011, Science.
[15] Soizik Donguy,et al. Experimental comparison of extreme-ultraviolet multilayers for solar physics. , 2004, Applied optics.
[16] H. Philipp. Influence of Oxide Layers on the Determination of the Optical Properties of Silicon , 1972 .
[17] D. Attwood. Soft X-Rays and Extreme Ultraviolet Radiation , 1999 .
[18] E. Anderson,et al. Interferometric lithography with an amplitude division interferometer and a desktop extreme ultraviolet laser , 2008 .
[19] Przemyslaw Wachulak,et al. Single-shot extreme ultraviolet laser imaging of nanostructures with wavelength resolution. , 2008, Optics letters.
[20] A. Giglia,et al. Design and performance of two-channel EUV multilayer mirrors with enhanced spectral selectivity , 2009 .
[21] Mónica Fernández-Perea,et al. Determination of optical constants of scandium films in the 20-1000 eV range. , 2006, Journal of the Optical Society of America. A, Optics, image science, and vision.
[22] Jingtao Zhu,et al. Comparison of Mg-based multilayers for solar He II radiation at 30.4 nm wavelength. , 2010, Applied optics.
[23] Torsten Feigl,et al. Enhanced reflectivity and stability of Sc/Si multilayers , 2004, SPIE Optics + Photonics.
[24] Eric M. Gullikson,et al. In-band and out-of-band reflectance calibrations of the EUV multilayer mirrors of the atmospheric imaging assembly instrument aboard the Solar Dynamics Observatory , 2012, Other Conferences.
[25] Taizo Sasaki,et al. Self-consistency and sum-rule tests in the Kramers-Kronig analysis of optical data: Applications to aluminum , 1980 .
[26] D. Windt,et al. Normal-incidence silicon-gadolinium multilayers for imaging at 63 nm wavelength. , 2008, Optics letters.
[27] J J Rocca,et al. Dense plasma diagnostics with an amplitude-division soft-x-ray laser interferometer based on diffraction gratings. , 2000, Optics letters.
[28] J. Rocca,et al. Characterization of Diffraction Gratings by use of a Tabletop Soft-X-Ray Laser. , 2001, Applied optics.
[29] J. Rocca,et al. Demonstration of a desk-top size high repetition rate soft x-ray laser. , 2005, Optics express.
[30] Benjawan Kjornrattanawanich,et al. Terbium-based extreme ultraviolet multilayers. , 2005, Optics letters.
[31] A. Vinogradov,et al. Determination of XUV optical constants by reflectometry using a high-repetition rate 46.9-nm laser , 1999 .
[32] Juan I. Larruquert,et al. Multilayer coatings for the far and extreme ultraviolet , 2011, Optics + Optoelectronics.
[33] David L. Windt,et al. Coated photodiode technique for the determination of the optical constants of reactive elements: La and Tb , 2006, SPIE Optics + Photonics.
[34] Eric M. Gullikson,et al. Recent developments in EUV reflectometry at the Advanced Light Source , 2001, SPIE Advanced Lithography.
[35] Regina Soufli,et al. Microroughness measurements and EUV calibration of the solar ultraviolet imager multilayer-coated mirrors , 2012, Other Conferences.
[36] J. Kortright,et al. Amorphous silicon carbide coatings for extreme ultraviolet optics. , 1988, Applied optics.
[37] E. Gullikson,et al. High-resolution, high-flux, user friendly VLS beamline at the ALS for the 50–1300 eV energy region , 1998 .
[38] E. Gullikson,et al. Reflectance measurements on clean surfaces for the determination of optical constants of silicon in the extreme ultraviolet-soft-x-ray region. , 1997, Applied optics.
[39] D. Windt,et al. Performance, structure, and stability of SiC/Al multilayer films for extreme ultraviolet applications. , 2009, Applied optics.
[40] G. Stoney. The Tension of Metallic Films Deposited by Electrolysis , 1909 .
[41] R. Hoover,et al. Soft X-ray Images of the Solar Corona with a Normal-Incidence Cassegrain Multilayer Telescope , 1988, Science.
[42] Eric M. Gullikson,et al. Soft-X-ray reflectivity and heat resistance of SiC/Mg multilayer , 2005 .