Extraction of Time Constants Ratio over Nine Orders of Magnitude for Understanding Random Telegraph Noise in MOSFETs

The numerous RTN characteristics in MOSFETs were evaluated accurately for a wide time range by the array test circuit. The time constants were extracted for over six orders of magnitude and there were no correlation between time to emission τe and time to capture τc. The time constant ratios were distributed over nine orders of magnitude. Measuring small amplitude and extracting time constants for wide range are useful to understand the trap properties in MOSFETs.