VSWR testing of RF-power GaN transistors
暂无分享,去创建一个
Olof Bengtsson | Wolfgang Heinrich | Joachim Wurfl | Serguei Chevtchenko | J. Wurfl | W. Heinrich | O. Bengtsson | S. Chevtchenko | Amitabh Chowdhary | A. Chowdhary
[1] Ruggedness improvement of RF DMOS devices , 2005 .
[2] T. Li,et al. Reliability of large periphery GaN-on-Si HFETs , 2005, [Reliability of Compound Semiconductors] ROCS Workshop, 2005..
[3] R. Trew,et al. AlGaN/GaN HFET reliability , 2009, IEEE Microwave Magazine.
[4] P. J. Tasker,et al. Development of a RF waveform stress test procedure for GaN HFETs subjected to infinite VSWR sweeps , 2012, 2012 IEEE/MTT-S International Microwave Symposium Digest.
[5] M. van Heijningen,et al. L-band AlGaN/GaN power amplifier with protection against load mismatch , 2013, 2013 European Microwave Integrated Circuit Conference.