In this work a easy-to-use system was built and used for fast shunt analysis of Industrial silicon solar cells using liquid crystal thermal foils. With this method, shunt detection is possible trough the visualization of the local power dissipation under an external bias. Six main shunt types where identified. After a detailed characterization their causes could be partially overcome. The shunt analysis enabled the statistic study of production shunts and the improvement of the production process, especially in case of edge isolation.