Interface characterization of high-quality SrTiO3 thin films on Si(100) substrates grown by molecular beam epitaxy
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J. Curless | S. Pietambaram | V. Kaushik | R. Droopad | J. Hallmark | J. Finder | Z. Yu | K. Eisenbeiser | C. Overgaard | P. Alluri | J. Ramdani | W. Ooms