Current drive enhancement by using high-permittivity gate insulator in SOI MOSFET's and its limitation

Speed enhancement effects by using a high-permittivity gate insulator in SOI MOSFETs and its limitation were investigated by a two-dimensional device simulator and circuit simulator. The SOI structure is suitable to have excellent current drive by using a high-permittivity gate insulator. Although the gate capacitance increases as a function of its dielectric constant, the current drive does not increase proportionally due to the inversion capacitance. According to the simulation results of the delay time, when the pulse waveforms driven by a CMOS inverter are propagated through 1 mm-long interconnects, the delay time significantly reduces at a dielectric constant value of around 25 (Ta/sub 2/O/sub 5/). Thus, it is worthwhile using Ta/sub 2/O/sub 5/ for gate insulator to achieve high-speed operation. Furthermore, the reduction of source parasitic series resistance is a key issue to realize the highest current drive by using a high-permittivity gate insulator in SOI MOSFET.

[1]  F. Assaderaghi,et al.  Recessed-channel structure for fabricating ultrathin SOI MOSFET with low series resistance , 1994, IEEE Electron Device Letters.

[2]  J.-P. Colinge,et al.  Hot-electron effects in Silicon-on-insulator n-channel MOSFET's , 1987, IEEE Transactions on Electron Devices.

[3]  S. Veeraraghavan,et al.  Short-channel effects in SOI MOSFETs , 1989 .

[4]  Katsuhiro Shimohigashi,et al.  Low-voltage ULSI design , 1993 .

[5]  D. Wouters,et al.  Subthreshold slope in thin-film SOI MOSFETs , 1990 .

[6]  Y. Omura,et al.  0.1- mu m-gate, ultrathin-film CMOS devices using SIMOX substrate with 80-nm-thick buried oxide layer , 1991, International Electron Devices Meeting 1991 [Technical Digest].

[7]  T. Houston,et al.  Ultra-thin film SOI/CMOS with selective-epi source/drain for low series resistance, high drive current , 1994, Proceedings of 1994 VLSI Technology Symposium.

[8]  Jeong-Mo Hwang,et al.  Novel polysilicon/TiN stacked-gate structure for fully-depleted SOI/CMOS , 1992, 1992 International Technical Digest on Electron Devices Meeting.

[9]  Hyung-Kyu Lim,et al.  Current-voltage characteristics of thin-film SOI MOSFET's in strong inversion , 1984, IEEE Transactions on Electron Devices.

[10]  K. Tokunaga,et al.  Increased drain saturation current in ultra-thin silicon-on-insulator (SOI) MOS transistors , 1988, IEEE Electron Device Letters.

[11]  Hiroaki Hazama,et al.  Observation of mobility enhancement in ultrathin SOI MOSFETs , 1988 .

[12]  F. Balestra,et al.  Double-gate silicon-on-insulator transistor with volume inversion: A new device with greatly enhanced performance , 1987, IEEE Electron Device Letters.

[13]  Y. Murao,et al.  An asymmetric sidewall process for high performance LDD MOSFET's , 1994 .

[14]  Jerry G. Fossum,et al.  Analysis and control of floating-body bipolar effects in fully depleted submicrometer SOI MOSFET's , 1991 .

[15]  Tadahiro Ohmi Trends for Future Silicon Technology , 1994 .

[16]  Enrico Sangiorgi,et al.  Scaling the MOS transistor below 0.1 /spl mu/m: methodology, device structures, and technology requirements , 1994 .

[17]  K. K. Young Short-channel effect in fully depleted SOI MOSFETs , 1989 .

[18]  Tadashi Shibata,et al.  Self-Aligned Aluminum-Gate MOSFET's Having Ultra-Shallow Junctions Formed by 450℃ Furnace Annealing (Special Issue on Sub-Half Micron Si Device and Process Technologies) , 1993 .

[19]  Dimitri A. Antoniadis,et al.  Optimization of series resistance in sub-0.2 /spl mu/m SOI MOSFETs , 1993, Proceedings of IEEE International Electron Devices Meeting.

[20]  K. Yamaguchi,et al.  A mobility model for carriers in the MOS inversion layer , 1983, IEEE Transactions on Electron Devices.