Optical constants of SrF2 thin films in the 25–780-eV spectral range

The transmittance and the optical constants of SrF2 thin films, a candidate material for multilayer coatings operating in the extreme ultraviolet and soft x-rays, have been determined in the spectral range of 25–780 eV, in most of which no experimental data were previously available. SrF2 films of various thicknesses were deposited by evaporation onto room-temperature, thin Al support films, and their transmittance was measured with synchrotron radiation. The transmittance as a function of film thickness was used to calculate the extinction coefficient k at each photon energy. A decrease in density with increasing SrF2 film thickness was observed. In the calculation of k, this effect was circumvented by fitting the transmittance versus the product of thickness and density. The real part of the refractive index of SrF2 films was calculated from k with Kramers-Kronig analysis, for which the measured spectral range was extended both to lower and to higher photon energies with data in the literature combined ...

[1]  J. Harrington,et al.  Ultraviolet-visible absorption in highly transparent solids by laser calorimetry and wavelength modulation spectroscopy. , 1978, Applied Optics.

[2]  C. Ribbing,et al.  Options for reststrahlen materials in optical surfaces and filters , 2009 .

[3]  Christopher T. Chantler,et al.  Theoretical Form Factor, Attenuation, and Scattering Tabulation for Z=1–92 from E=1–10 eV to E=0.4–1.0 MeV , 1995 .

[4]  Taizo Sasaki,et al.  Self-consistency and sum-rule tests in the Kramers-Kronig analysis of optical data: Applications to aluminum , 1980 .

[5]  J. Frandon,et al.  Spectra of Electronic Excitations in CaF2, SrF2, and BaF2 in the 8 to 150 eV Range , 1972 .

[6]  Transmittance and optical constants of Sr films in the 6–1220 eV spectral range , 2012 .

[7]  Y. A. Unspenskii,et al.  Generation and application of a high-average-power polarized soft-x-ray laser beam , 2001 .

[8]  Norbert Kaiser,et al.  Structure of thin fluoride films deposited on amorphous substrates , 1992 .

[9]  E. Gullikson,et al.  High-resolution, high-flux, user friendly VLS beamline at the ALS for the 50–1300 eV energy region , 1998 .

[10]  Stefan K. Andersson,et al.  Infrared reflectance spectroscopy for surface topographic analysis of reststrahlen materials , 1994, Other Conferences.

[11]  T. Miyata,et al.  Optical Studies of Alkali Fluorides and Alkaline Earth Fluorides in VUV Region , 1969 .

[12]  W. Spitzer,et al.  INFRARED PROPERTIES OF CaF$sub 2$, SrF$sub 2$, AND BaF$sub 2$ , 1962 .

[13]  Karen J. Olsen,et al.  X-Ray Form Factor, Attenuation and Scattering Tables (version 2.0) , 2003 .

[14]  A Hordvik,et al.  Photoacoustic measurements of surface and bulk absorption in HF/DF laser window materials. , 1977, Applied optics.

[15]  M. Thomas Strontium Fluoride (SrF2) , 1997 .

[16]  E. Gullikson 13. Optical Properties of Materials , 1998 .

[17]  Samuel Tolansky,et al.  Multiple-beam interferometry of surfaces and films , 1948 .

[18]  G. Hass,et al.  Vacuum Deposition of Dielectric and Semiconductor Films by a CO(2) Laser. , 1969, Applied optics.

[19]  B. L. Henke,et al.  X-Ray Interactions: Photoabsorption, Scattering, Transmission, and Reflection at E = 50-30,000 eV, Z = 1-92 , 1993 .

[20]  H. Craighead,et al.  Vacuum ultraviolet loss in magnesium fluoride films. , 1984, Applied optics.

[21]  David L. Windt,et al.  IMD—software for modeling the optical properties of multilayer films , 1998 .

[22]  N. Kaiser,et al.  Optical interference coatings , 2003 .

[23]  Eric M. Gullikson,et al.  Recent developments in EUV reflectometry at the Advanced Light Source , 2001, SPIE Advanced Lithography.