An effective diagnosis method to support yield improvement
暂无分享,去创建一个
[1] Anjali Kinra,et al. Logic mapping on a microprocessor , 2000, Proceedings International Test Conference 2000 (IEEE Cat. No.00CH37159).
[2] Camelia Hora,et al. On a Statistical Fault Diagnosis Approach Enabling Fast Yield Ramp-Up , 2003, J. Electron. Test..
[3] Robert C. Aitken. Modeling the Unmodelable: Algorithmic Fault Diagnosis , 1997, IEEE Des. Test Comput..
[4] G. Sery,et al. Knowledge-based electrical monitor approach using very large array yield structures to delineate defects during process development and production yield improvement , 1991, [Proceedings] 1991 International Workshop on Defect and Fault Tolerance on VLSI Systems.
[5] Young-Jun Kwon,et al. Yield learning via functional test data , 1995, Proceedings of 1995 IEEE International Test Conference (ITC).
[6] Arun Gunda,et al. Failure analysis for full-scan circuits , 1995, Proceedings of 1995 IEEE International Test Conference (ITC).
[7] M.A. Merino,et al. SmartBit/sup TM/: bitmap to defect correlation software for yield improvement , 2000, 2000 IEEE/SEMI Advanced Semiconductor Manufacturing Conference and Workshop. ASMC 2000 (Cat. No.00CH37072).
[8] D. M. H. Walker,et al. Improvement of SRAM-based failure analysis using calibrated Iddq testing , 1996, Proceedings of 14th VLSI Test Symposium.
[9] John M. Acken,et al. Fault Model Evolution For Diagnosis: Accuracy vs Precision , 1992, 1992 Proceedings of the IEEE Custom Integrated Circuits Conference.
[10] M. Lousberg,et al. On Electrical Fault Diagnosis in Full-Scan Circuits , 2001 .
[11] Kenneth M. Butler,et al. Correlation of logical failures to a suspect process step , 1999, International Test Conference 1999. Proceedings (IEEE Cat. No.99CH37034).
[12] Wojciech Maly,et al. Yield-oriented computer-aided defect diagnosis , 1995 .
[13] F. Joel Ferguson,et al. Sandia National Labs , 2022 .
[14] W. Kent Fuchs,et al. TWO-STAGE FAULT LOCATION , 1991, 1991, Proceedings. International Test Conference.