Development of an objective flat-field spectrograph for electron microscopic soft x-ray emission spectrometry in 50-4000 eV
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T. Imazono | M. Koike | T. Kawachi | N. Hasegawa | M. Koeda | T. Nagano | H. Sasai | Y. Oue | Z. Yonezawa | S. Kuramoto | M. Terauchi | H. Takahashi | N. Handa | T. Murano
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