Status of High-Index Materials for Generation-Three 193nm Immersion Lithography
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Paul Zimmerman | Bryan J. Rice | Jeff D. Byers | Idriss Blakey | Heping Liu | Juan López Gejo | Nicholas J. Turro | Bronwin Dargaville | Chris K. Van Peski | Lan Chen | Xuegong Lei | Vladmir Liberman | Steve Palmacci | Mordy Rothchild | Andrew Whitker
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