Stress Gradient Induced Strain Localization in Metals: High Resolution Strain Cross Sectioning via Synchrotron X-Ray Diffraction

Strain localization in the presence of a stress gradient is a phenomenon common to many systems described by continuum mechanics. Variations of this complex phenomenon lead to interesting nonlinear effects in materials/engineering science as well as in other fields. Here, the synchrotron based energy dispersive x-ray diffraction (EDXRD) technique is used for high spatial resolution profiling of both compression and tension induced strain localization in important materials/engineering problems. Specifically, compression induced strain localization in shot peened materials and tension induced strain localization in the plastic zones adjoining the faces of a fatigue crack are profiled. The utility of the EDXRD synchrotron technique for nondestructively cross-sectioning strain variations on small length scales (down to 10-20 μm) is described. While the strain field profiling relies on the shift of the Bragg lines, the data show that plastic deformation regions can also consistently be seen in the broadening of the Bragg peaks through the full width at half maximum parameter. Quantitative correlations between the synchrotron based x-ray determined deformations and surface deformations, as measured by optical surface height profiling, are also made.

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