Modified PRPG for Test Data Reduction Using BAST Structure
暂无分享,去创建一个
[1] Yun Chen,et al. A test pattern matching method on bast architecture using don't care identification for random pattern resistant faults , 2010, 2010 10th International Symposium on Communications and Information Technologies.
[2] Janusz Rajski,et al. Automated synthesis of phase shifters for built-in self-testapplications , 2000, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..
[3] Masaki Hashizume,et al. Scan Chain Ordering to Reduce Test Data for BIST-Aided Scan Test Using Compatible Scan Flip-Flops , 2010, IEICE Trans. Inf. Syst..
[4] Kwame Osei Boateng,et al. BIST-aided scan test - a new method for test cost reduction , 2003, Proceedings. 21st VLSI Test Symposium, 2003..
[5] Vishwani D. Agrawal,et al. A Tutorial on Built-in Self-Test. I. Principles , 1993, IEEE Des. Test Comput..