Modified PRPG for Test Data Reduction Using BAST Structure

[1]  Yun Chen,et al.  A test pattern matching method on bast architecture using don't care identification for random pattern resistant faults , 2010, 2010 10th International Symposium on Communications and Information Technologies.

[2]  Janusz Rajski,et al.  Automated synthesis of phase shifters for built-in self-testapplications , 2000, IEEE Trans. Comput. Aided Des. Integr. Circuits Syst..

[3]  Masaki Hashizume,et al.  Scan Chain Ordering to Reduce Test Data for BIST-Aided Scan Test Using Compatible Scan Flip-Flops , 2010, IEICE Trans. Inf. Syst..

[4]  Kwame Osei Boateng,et al.  BIST-aided scan test - a new method for test cost reduction , 2003, Proceedings. 21st VLSI Test Symposium, 2003..

[5]  Vishwani D. Agrawal,et al.  A Tutorial on Built-in Self-Test. I. Principles , 1993, IEEE Des. Test Comput..