Energy Dependent Sensitivity of Microchannel Plate Detectors

Understanding of microchannel plate (MCP) detectors with x-ray energy is important for applications in high energy density research such as broadband imaging and x-ray spectroscopy. The relative sensitivity with photon energy for Cu∕Au coated MCPs in the range of 250eV<hν<5000eV has been measured at the National Synchrotron Light Source. A model of this response that includes contributions from secondary photoelectron yield and interactions with multiple channels is presented. This model is shown to agree with the measured MCP response to <20% over the majority of the spectral range using cross sections determined from an independent analysis of the MCP glass composition.

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