Investigation on Erosion of Cu/W Contacts in High-Voltage Circuit Breakers
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V. Behrens | T. Honig | J. Tepper | M. Seeger | T. Votteler | M. Seeger | T. Votteler | J. Tepper | T. Honig | V. Behrens | Jens Tepper | Martin Seeger | Volker Behrens
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