Accurate on wafer measurement of phase and amplitude of the spectral components of incident and scattered voltage waves at the signal ports of a nonlinear microwave device

A measurement setup and calibration procedure are described allowing the accurate on wafer measurement of phases and amplitudes of the spectral components of incident and scattered voltage waves at the signal ports of a nonlinear microwave device. A comparison is made between measurements performed with the setup and simulations based on a Root-model.<<ETX>>

[1]  J. Verspecht,et al.  Individual characterization of broadband sampling oscilloscopes with a 'nose-to-nose' calibration procedure , 1993, 1993 IEEE Instrumentation and Measurement Technology Conference.

[2]  U. Lott.  Measurement of magnitude and phase of harmonics generated in nonlinear microwave two-ports , 1989 .

[3]  Kari Lehtinen,et al.  High-frequency periodic time-domain waveform measurement system , 1988 .

[4]  David E. Root,et al.  Technology Independent Large Signal Non Quasi-Static FET Models by Direct Construction from Automatically Characterized Device Data , 1991, 1991 21st European Microwave Conference.

[5]  Andrea Pierenrico Ferrero,et al.  An improved calibration technique for on-wafer large-signal transistor characterization , 1993 .

[6]  Karsten P. Ulland,et al.  Vii. References , 2022 .

[7]  J. Verspecht,et al.  Calibrated vectorial nonlinear-network analyzers , 1994, 1994 IEEE MTT-S International Microwave Symposium Digest (Cat. No.94CH3389-4).

[8]  Alberto L. Sangiovanni-Vincentelli,et al.  Simulation of Nonlinear Circuits in the Frequency Domain , 1986, IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems.

[9]  M. Demmler,et al.  On-wafer large signal power, S-parameter and waveform measurement system , 1994, Third International Workshop on Integrated Nonlinear Microwave and Millimeterwave Circuits.

[10]  Gunter Kompa,et al.  Error-corrected large-signal waveform measurement system combining network analyzer and sampling oscilloscope capabilities , 1990 .

[11]  B. Schiek,et al.  Thru-Match-Reflect: One Result of a Rigorous Theory for De-Embedding and Network Analyzer Calibration , 1988, 1988 18th European Microwave Conference.