论文信息 - Evaluation of Long-Term Reliability and Overcurrent Capabilities of 15-kV SiC MOSFETs and 20-kV SiC IGBTs During Narrow Current Pulsed Conditions - 字舞流文

Evaluation of Long-Term Reliability and Overcurrent Capabilities of 15-kV SiC MOSFETs and 20-kV SiC IGBTs During Narrow Current Pulsed Conditions

S. Bayne | H. O’Brien | A. Ogunniyi | J. Schrock | E. Hirsch | S. Lacouture | A. Bilbao | Matthew Kim | J. Forbes