Impact of Width Variation of Global Inductive VLSI Interconnect Line
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Noha H. Mahmoud | R. Chandel | J. Meindl | Xuejue Huang | Jing-Yang Jou | Yao-Wen Chang | A. Naeemi | R. Venkatesan | G. Khanna | Shang-Wei Tu | Diwakar Singh | X. C. Li | J. Mao | H. F. Huang | A. Roy