论文信息 - Scanning force microscopy using a simple low‐noise interferometer

Scanning force microscopy using a simple low‐noise interferometer

A force microscope is described that can be used for high‐resolution surface profiling and for observing magnetic domains. The microscope uses a Michelson interferometer to sense the vibration of a cantilever. The interferometer contains some straightforward processing to eliminate laser intensity noise. Some measuring results are presented that illustrate the performance of the microscope.

A. Boef

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