The measurement of baseband pulse rise times of less than 10 -9 second

Tiffs is a review paper dealing with the measurement of fractional nanosecond pulse rise time in which the following subjects are discussed: oscillographic systems, pulse comparison techniques, a basic instrumentation system, and the distortion of pulses by transmission lines. Extensive references are provided. Included in the discussion is a delineation of equivalent-time oscillographic sampling systems and a classification into three sampling categories: sequential, random, and multiple. Also considered are single transient oscillographic systems employing either traveling-wave-deflection structure cathode ray tubes or multiple sampling methods. In order to clearly present the rise-time limitations caused by TEM transmission lines, attention is given to the distortion incurred by pulses upon passing through such lines. Some suggestions and predictions relating to future work are presented.

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