论文信息 - Ambipolar diffusion length in a-Si:H(F) and a-Si,Ge:H,F measured with the steady-state photocarrier grating technique - 字舞流文

Ambipolar diffusion length in a-Si:H(F) and a-Si,Ge:H,F measured with the steady-state photocarrier grating technique

S. Wagner | J. Conde | P. Roca i Cabarrocas | A. Delahoy | H. Park | J.Z. Liu | X. Li | A. Maruyama