An approach to statistical analysis of gate oxide breakdown mechanisms
暂无分享,去创建一个
[1] R. Degraeve,et al. A new model for the field dependence of intrinsic and extrinsic time-dependent dielectric breakdown , 1998 .
[2] H. Akaike. A new look at the statistical model identification , 1974 .
[3] Milton Ohring,et al. Reliability and Failure of Electronic Materials and Devices, Second Edition , 1998 .
[4] Dezhong Yao,et al. An efficient composite simulated annealing algorithm for global optimization , 2002, IEEE 2002 International Conference on Communications, Circuits and Systems and West Sino Expositions.
[5] Matija Fajdiga,et al. Reliability approximation using finite Weibull mixture distributions , 2004, Reliab. Eng. Syst. Saf..
[6] D. Rubin,et al. Maximum likelihood from incomplete data via the EM - algorithm plus discussions on the paper , 1977 .
[7] S. Brooks,et al. Optimization Using Simulated Annealing , 1995 .
[8] Dimitri Kececioglu,et al. Maximum likelihood estimates, from censored data, for mixed-Weibull distributions , 1992 .