Throughput Measurement of a Multilayer-Coated Schwarzschild Objective Using Synchrotron Radiation
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M. Oshima | T. Kiyokura | F. Maeda | Y. Iketaki | Y. Horikawa | E. Shigemasa | A. Yagishita | K. Nagai | Y. Watanabe
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M. Oshima | T. Kiyokura | F. Maeda | Y. Iketaki | Y. Horikawa | E. Shigemasa | A. Yagishita | K. Nagai | Y. Watanabe