Numerical analysis of optically pumped VECSELs
暂无分享,去创建一个
[1] R. Kudrawiec,et al. An attempt to design long-wavelength (>2 μm) InP-based GaInNAs diode lasers , 2012 .
[2] Safa Kasap,et al. Springer Handbook of Electronic and Photonic Materials , 2007 .
[3] G. P. Srivastava,et al. Temperature dependence of the thermal conductivity of different forms of diamond , 2007 .
[4] Stanko Tomić,et al. A quantitative study of radiative, Auger, and defect related recombination processes in 1.3-/spl mu/m GaInNAs-based quantum-well lasers , 2002 .
[5] Wlodzimierz Nakwaski,et al. Thermal conductivity of binary, ternary, and quaternary III‐V compounds , 1988 .
[6] E. F. Steigmeier,et al. Electron and Phonon Scattering in GaAs at High Temperatures , 1965 .
[7] Tomi Jouhti,et al. A 0.6W cW GaInNAs vertical external cavity surface-emitting laser at 1.32µm , 2004 .
[8] J. Geske,et al. Vertical-cavity surface-emitting laser active regions for enhanced performance with optical pumping , 2004, IEEE Journal of Quantum Electronics.
[9] S. Adachi. GaAs, AlAs, and AlxGa1−xAs: Material parameters for use in research and device applications , 1985 .
[10] Hirofumi Namizaki,et al. Current dependence of spontaneous carrier lifetimes in GaAs–Ga1‐xAlx As double‐heterostructure lasers , 1974 .
[11] Robert P. Sarzała,et al. Carrier diffusion inside active regions of gain-guided vertical-cavity surface-emitting lasers , 1997 .
[12] P. Westbergh,et al. High speed VCSELs for optical interconnects , 2012, 2012 International Conference on Indium Phosphide and Related Materials.
[13] G. Tränkle,et al. The impact of defects to minority-carrier dynamics in heavily doped GaAs:C analyzed by transient photoluminescence spectroscopy , 2002 .
[14] H. Sigg,et al. The refractive index of AlxGa1−xAs below the band gap: Accurate determination and empirical modeling , 2000 .
[15] W. M. Haynes. CRC Handbook of Chemistry and Physics , 1990 .
[16] J. Dyment,et al. Dependence of threshold and electron lifetime on acceptor concentration in GaAs–Ga1−xAlxAs lasers , 1973 .
[17] R. Sarzała,et al. Comparative analysis of thermal problems in GaAs- and InP-based 1.3-µm VECSELs , 2013 .