Excess-current-free stacked Josephson junctions with high IcRn product
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H. Hayakawa | A. Fujimaki | S. Izawa | M. Inoue | Y. Yoshinaga | T. Kito
[1] H. Hayakawa,et al. Characteristics of Interface-Modified Josephson Junctions Fabricated under Various Etching Conditions , 2000 .
[2] H. Hayakawa,et al. Interface-Treated Josephson Junctions in Trilayer Structures , 2000 .
[3] H. Hayakawa,et al. Preparation of ramp-edge Josephson junctions with natural barriers , 1999, IEEE Transactions on Applied Superconductivity.
[4] R. Dittmann,et al. Fabrication of YBa/sub 2/Cu/sub 3/O/sub 7/ ramp-type junctions by interface treatments , 1999, IEEE Transactions on Applied Superconductivity.
[5] M. Forrester,et al. High-resistance HTS edge junctions for digital circuits , 1999, IEEE Transactions on Applied Superconductivity.
[6] K. Char,et al. Properties of interface-engineered high Tc Josephson junctions , 1997 .
[7] P. Fons,et al. Disappearance of the surface Cu-Se second phase during post-growth annealing of CuInSe2 epitaxial films grown under excess Cu-flux conditions , 2000 .