Ultrasonic POD Model Validation and Development for Focused Probes

The growing need to quantify the ability to inspect a component at the design stage requires accurate and computationally efficient analytical models of the inspection process. In ultrasonics, a computer model has been developed which can simulate signals obtained from both crack-like and volumetric defects [1,2], and can estimate their probability of detection (POD) [3,4]. This model can be used to predict and optimize the inspection reliability with respect to the inspection system, the component design, and the critical defects.