On the Second‐Order and Orientation Analysis of Planar Stationary Point Processes

The paper presents a method for the second-order analysis of point processes, and, basing on it, for their orientation analysis. For the reduced second moment measure of stationary and of stationary and isotropic point processes a new estimator is given, which has some advantages in comparison to RIPLEY's estimator. Three examples illustrate the use of the statistical techniques.