A microcomputer-based deep-level transient spectroscopy (DLTS) system

A totally automated, microcomputer-based deep-level transient spectroscopy (DLTS) system developed at the University of Arkansas is described. The hardware and interfaces are discussed in terms of their accuracy and contribution to the requirements for performing DLTS measurements. The software developed to control the hardware, as well as that used to acquire, reduce, and manipulate the data, is explained. The software introduces the concept of building a database by sampling the transient decay at equal intervals over a temperature scan of equal temperature increments. This method allows for cycling the hardware and test device only once through a temperature scan and storing the data for later analysis.